Unlocking the Secrets of Semi-Crystal Solutions: Webinar Now On Demand!

We recently hosted an insightful webinar on Semi-Crystal Solutions, where our expert delved into the latest advancements and applications in the field. The event was a resounding success, with a vibrant exchange of ideas and a highly engaged audience. For those who missed it, we are excited to announce that the event is now available on demand, including the Q&A session with our experts.

Is it possible to measure the layer and the substrate orientation?

It depends on a case-by-case basis. If we have an epitaxy sample, a substrate with a layer on top, the thickness and composition of this layer will determine whether we can measure one or both. If the layer is extremely thin, we will not get enough X-rays from it. If the layer is very thick, we won’t get signal from the substrate anymore. If it is a homoepitaxial layer, we cannot really distinguish it. We can measure it if we have a thick epitaxial layer, but we would have to flip it upside down, which sometimes is not what is sought after by the experts.

What is the smallest sample you could measure?

The spot size that we have, when the tube is pointing 90 degrees over the sample, is about 1mm. That means we can measure sample from about 2×2 mm. If the sample is smaller, you cannot guarantee that that sample won’t move during the measurement.

What are the differences between the mapping tables in the SDCOM and the Omega Theta?

The biggest difference is that the mapping table for the SDCOM can map an area of about 4x4cm. It can go 2cm out of center position in each direction, before it bumps into other parts of the system. The Omega theta on the other hand, it can map a 300mm wafer due to it having more space than the SDCOM.

What our customers are saying

Customers have praised the SDCOM for its precision and versatility in crystal orientation measurements. Users appreciate its ability to handle a wide range of sample sizes and its ultra-fast measurement capabilities. The intuitive XRD Suite software and the air-cooled X-ray tube are also highlighted as significant advantages, making the system easy to integrate and maintain.

The Omega Theta receives high marks for its high-precision mapping capabilities, especially for large wafers up to 300 mm in diameter. Customers value its robust construction and the spacious design that allows for comprehensive mapping without interference. The system’s flexibility in supporting various materials and sample geometries is also frequently mentioned as a key benefit.

Further reading

• Is the Omega/Theta or SDCOM best for YOUR crystal orientation and mapping needs?
• Crystal Orientation: Unlocking Precision with SDCOM
• Brochure: SDCOM – Smart diffractometer for crystal orientation measurements
• Brochure: Omega / Theta – Maximum precision, maximum versatility

We hope you find these resources valuable and look forward to your continued engagement with our innovative solutions. Feel free to reach out with any questions or for further information. Happy exploring!